top of page
Search
dingjunkpipytang

NI Circuit Design Suite 11.0 Serial Number Free Download: How to Get the Complete Set of Tools for C



I believe would have to be shipped as it is a CD installation. There aren't actually any newer versions of Multisim as you can see on the National Instruments page for it: -us/support/downloads/software-products/download.multisim.html#312060. The latest version available is 14.2, which I believe we ship now, so perhaps it is possible that we can just email the appropriate serial number/activation code and you use it to appropriately activate the software after downloading it from NI's website. Whether or not that is worth it to you is more of a personal opinion so I won't be of much help in that regard.




ni circuit design suite 11.0 serial number free download




Tags:activate, analysis, circuit design, desktop icon, download, HED, help, higher education, How to, Install, Installation, Multisim 14.1, National Instruments, NI, NI Account, NI Circuit Design Suite, NI ELVISmx, NI License Manager, Support, tutorial


Abstract:In aerospace environments, high reliability and low power consumption of chips are essential. To greatly reduce power consumption, the latches of a chip need to enter the power down operation. In this operation, employing non-volatile (NV) latches can retain circuit states. Moreover, a latch can be hit by a radiative particle in the aerospace environment, which can cause a severe soft error in the worst case. This paper presents a NV-latch based on resistive random-access memories (ReRAMs) for NV and robust applications. The proposed NV-latch is radiation-hardened with low overhead and can restore values after power down operation. Simulation results demonstrate that the proposed NV-latch can completely provide radiation hardening capability against single-event upsets (SEUs) and can restore values after power down operation. The proposed NV-latch can reduce the number of transistors in the storage cells by 50% on average compared with the other similar solutions.Keywords: resistive random-access memory; non-volatile; circuit reliability; latch design; single-event upset 2ff7e9595c


0 views0 comments

Recent Posts

See All

Comments

Couldn’t Load Comments
It looks like there was a technical problem. Try reconnecting or refreshing the page.
bottom of page